Dr. Wayne R. McKinney
Adjunct Professor of Astronomy
SPIE Involvement:
Senior status | Conference Program Committee | Conference Chair | Author | Editor
Area of Expertise:
Diffraction Gratings , VUV and Soft X-ray Optics , Optical Metrology , Grazing Incidence Optical Path , Scientific Programming , Ray Tracing
Websites:
Publications (56)

PROCEEDINGS ARTICLE | September 7, 2017
Proc. SPIE. 10385, Advances in Metrology for X-Ray and EUV Optics VII
KEYWORDS: X-ray optics, Metrology, Interferometry, Prisms, Optical metrology, Free electron lasers, Diffraction, Synchrotrons, Coherent x-ray sources, X-ray sources

SPIE Journal Paper | October 12, 2015
OE Vol. 54 Issue 10
KEYWORDS: Metrology, X-ray optics, Control systems, Mirrors, Humidity, X-rays, Temperature metrology, Interferometry, Calibration, Particles

PROCEEDINGS ARTICLE | September 1, 2015
Proc. SPIE. 9576, Applied Advanced Optical Metrology Solutions
KEYWORDS: Modulation transfer functions, Binary data, Calibration, Spatial frequencies, Standards development, Optical microscopes, Silicon, Error analysis, Sensors, Optical fabrication

PROCEEDINGS ARTICLE | September 17, 2014
Proc. SPIE. 9206, Advances in Metrology for X-Ray and EUV Optics V
KEYWORDS: Calibration, X-ray optics, Mirrors, Metrology, Autocollimators, Optical testing, Optical spheres, Light sources, Spherical lenses, Precision calibration

PROCEEDINGS ARTICLE | September 17, 2014
Proc. SPIE. 9206, Advances in Metrology for X-Ray and EUV Optics V
KEYWORDS: Metrology, X-ray optics, Calibration, Mirrors, Humidity, Temperature metrology, Optical testing, Interferometry, Control systems, Particles

PROCEEDINGS ARTICLE | September 27, 2013
Proc. SPIE. 8848, Advances in X-Ray/EUV Optics and Components VIII
KEYWORDS: Mirrors, Beam splitters, Sensors, Fabry–Perot interferometers, Metrology, X-ray optics, Interferometers, Fourier transforms, Coating, Data acquisition

Showing 5 of 56 publications
Conference Committee Involvement (6)
Advances in Metrology for X-Ray and EUV Optics IV
12 August 2012 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics III
1 August 2010 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics II
30 August 2007 | San Diego, California, United States
Theory and Practice of Surface-Relief Diffraction Gratings: Synchrotron and Other Applications
20 July 1998 | San Diego, CA, United States
Gratings and Grating Monochromators for Synchrotron Radiation
31 July 1997 | San Diego, CA, United States
Showing 5 of 6 published special sections
Course Instructor
NON-SPIE: Diffraction Gratings: Manufacture, Specification, and Application
Diffraction gratings are the most important wavelength dispersing optic from the soft x-ray to the infrared. This tutorial outlines the important details about the manufacture and specification of this important optical component. Both ruled and interferometrically generated gratings are covered, emphasizing the differences and unique advantages of each type. Important applications of gratings are briefly covered at the end of the tutorial. The tutorial was presented at the SPIE Annual Meeting in San Diego in conjunction with Conference 503, "International Conference on the Application, Theory, and Fabrication of Periodic Structures, Diffraction Gratings, and Moire Phenomena II.
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