Prof. Daewook Kim
Associate Professor
SPIE Involvement:
Engineering, Science, and Technology Policy Committee | Board of Directors | Nominating and Leadership Development Committee | Conference Program Committee | Conference Chair | Author | Editor | Instructor
Area of Expertise:
large precision optics fabrication using Computer Controlled Optical Surfacing (CCOS) process , open-source data analysis and visualization S/W platform development , optical testing for large optical components using computer generated holograms, laser tracker, interferometer , optical system design and manufacturing
Websites:
Publications (136)

SPIE Journal Paper | 16 November 2023 Open Access
JATIS, Vol. 9, Issue 04, 048003, (November 2023) https://doi.org/10.1117/12.10.1117/1.JATIS.9.4.048003
KEYWORDS: Matrices, Point spread functions, Diffraction, Modeling, Observatories, Ray tracing, Coronagraphy, Physics, Gaussian beams, Design

Proceedings Article | 5 October 2023 Poster + Paper
Proceedings Volume 12680, 126802E (2023) https://doi.org/10.1117/12.2677654
KEYWORDS: Wavefront errors, Telescopes, Coronagraphy, Wavefronts, Space telescopes, Exoplanets, Sensors, Optical simulations, Device simulation, Deformable mirrors

Proceedings Article | 5 October 2023 Presentation
Proceedings Volume PC12677, PC126770I (2023) https://doi.org/10.1117/12.2677878
KEYWORDS: Microelectromechanical systems, Deformable mirrors, Wavefronts, Equipment, Coronagraphy, Control systems, Vacuum, Stars, Space observatories, Optical benches

Proceedings Article | 5 October 2023 Presentation
Proceedings Volume PC12677, PC126770G (2023) https://doi.org/10.1117/12.2677762
KEYWORDS: Telescopes, Optical alignment, Space telescopes, Optical fabrication, Lenses, Fabrication, Wavefronts, Stray light, Spectroscopy, Space mirrors

Proceedings Article | 5 October 2023 Presentation
Haeun Chung, Carlos Vargas, Aafaque Khan, Jason Corliss, Daewook Kim, Heejoo Choi
Proceedings Volume PC12677, PC126770D (2023) https://doi.org/10.1117/12.2678100
KEYWORDS: Telescopes, Spectroscopy, Optical alignment, Computer generated holography, Microchannel plates, Extreme ultraviolet, Tolerancing, Optical gratings, Galactic astronomy, Satellites

Showing 5 of 136 publications
Proceedings Volume Editor (12)

Showing 5 of 12 publications
Conference Committee Involvement (28)
Interferometry and Structured Light 2024
21 August 2024 | San Diego, California, United States
Optical Manufacturing and Testing 2024
20 August 2024 | San Diego, California, United States
Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation VI
16 June 2024 | Yokohama, Japan
Optics and Photonics for Advanced Dimensional Metrology III
9 April 2024 | Strasbourg, France
Astronomical Optics: Design, Manufacture, and Test of Space and Ground Systems IV
21 August 2023 | San Diego, California, United States
Showing 5 of 28 Conference Committees
Course Instructor
SC212: Modern Optical Testing
This course describes the basic interferometry techniques used in the evaluation of optical components and optical systems. It discusses interferogram interpretation, computer analysis, and phase-shifting interferometry, as well as various commonly used wavefront-measuring interferometers. The instructor describes specialized techniques such as testing windows and prisms in transmission, 90-degree prisms and corner cubes, measuring index inhomogeneity, and radius of curvature. Testing cylindrical and aspheric surfaces, determining the absolute shape of flats and spheres, and the use of infrared interferometers for testing ground surfaces are also discussed. The course also covers state-of-the-art direct phase measurement interferometers.
SC213: Introduction to Interferometric Optical Testing
This short course introduces the field of interferometric optical testing. Topics covered include basic interferometers for optical testing, and concepts of phase-shifting interferometry including error analysis. Long wavelength interferometry, testing of aspheric surfaces, measurement of surface microstructure, and the state-of-the-art of direct phase measurement interferometers are also discussed.
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