Front Matter
Proc. SPIE 7729, Front Matter: Volume 7729, 772901 (22 June 2010); doi: 10.1117/12.869740
Plenary Session
Proc. SPIE 7729, Peering into the secrets of food and agricultural co-products, 772903 (15 June 2010); doi: 10.1117/12.861953
Proc. SPIE 7729, Electron microscopy of polymer-carbon nanotubes composites, 772904 (8 June 2010); doi: 10.1117/12.867718
Advancements in Particle Beam Microscopy I
Proc. SPIE 7729, Microstructure and texture analysis of advanced copper using electron backscattered diffraction and scanning transmission electron microscopy, 77290B (9 June 2010); doi: 10.1117/12.852908
Proc. SPIE 7729, Measuring the beam size of a focused ion beam (FIB) system, 77290C (3 June 2010); doi: 10.1117/12.853027
Advancements in Particle Beam Microscopy II
Proc. SPIE 7729, NEW scanning electron microscope magnification calibration reference material (RM) 8820, 77290D (3 June 2010); doi: 10.1117/12.859118
Proc. SPIE 7729, A method for determining oceanic particle size distributions and particle composition using scanning electron microscopy coupled with energy dispersive spectroscopy, 77290E (28 May 2010); doi: 10.1117/12.853455
Proc. SPIE 7729, Pushing the envelope with SEM/SDD-EDS mapping: X-ray spectrum image mapping in 30 seconds or less, but what are the real limits?, 77290F (3 June 2010); doi: 10.1117/12.853519
Proc. SPIE 7729, Techniques for improving material fidelity and contrast consistency in secondary electron mode helium ion microscope (HIM) imaging, 77290J (3 June 2010); doi: 10.1117/12.861488
Advancements in Scanned Probe Microscopy
Proc. SPIE 7729, Traceable nanoscale length metrology using a metrological Scanning Probe Microscope, 77290L (3 June 2010); doi: 10.1117/12.853788
Proc. SPIE 7729, Interlaboratory comparison of traceable atomic force microscope pitch measurements, 77290M (10 June 2010); doi: 10.1117/12.858353
Proc. SPIE 7729, Advanced 3D metrology atomic force microscope with crosstalk eliminated, 77290N (3 June 2010); doi: 10.1117/12.853679
Proc. SPIE 7729, Low tip damage AFM technique development for nano structures characterization, 77290O (3 June 2010); doi: 10.1117/12.853948
Advancements in Particle Beam Microscopy III
Proc. SPIE 7729, Physico-chemical characterization of engineered metal oxide nanoparticles: the critical role of microscopy, 77290Q (3 June 2010); doi: 10.1117/12.853772
Proc. SPIE 7729, Complementing and adding to SEM performance with the addition of XRF, Raman, CL and PL spectroscopy and imaging, 77290R (10 June 2010); doi: 10.1117/12.864236
Proc. SPIE 7729, Electron microscopy and cathodoluminescence in electrospun nanodimensional structures: challenges and opportunities, 77290T (10 June 2010); doi: 10.1117/12.866761
Particle Beam and Scanned Probe Modeling I
Proc. SPIE 7729, Modeling of charging effects in scanning ion microscopes, 77290V (3 June 2010); doi: 10.1117/12.853488
Proc. SPIE 7729, Comprehensive simulation of SEM images taking into account local and global electromagnetic fields, 77290W (9 June 2010); doi: 10.1117/12.859951
Proc. SPIE 7729, A novel Monte Carlo simulation code for linewidth measurement in critical dimension scanning electron microscopy, 77290X (3 June 2010); doi: 10.1117/12.853804
Proc. SPIE 7729, Advances in modeling of scanning charged-particle-microscopy images, 77290Z (3 June 2010); doi: 10.1117/12.861064
Proc. SPIE 7729, Optimizing the detector configuration for SEM topographic contrast by using a Monte Carlo simulation, 772910 (3 June 2010); doi: 10.1117/12.859775
Proc. SPIE 7729, A feature-based approach for processing nanoscale images, 772911 (3 June 2010); doi: 10.1117/12.853412
Forensic Microscopy: Applications, Analyses and Research
Proc. SPIE 7729, Is this charred material from a VHS video cassette?, 772913 (9 June 2010); doi: 10.1117/12.853718
Proc. SPIE 7729, Dental materials as an aid for victim identification: examination of calcined remains by SEM/EDS, 772914 (3 June 2010); doi: 10.1117/12.853311
Proc. SPIE 7729, Scanning methods applied to bitemark analysis, 772915 (3 June 2010); doi: 10.1117/12.853312
Proc. SPIE 7729, The influence of surface chemistry on GSR particles: using XPS to complement SEM/EDS analytical techniques, 772916 (9 June 2010); doi: 10.1117/12.863906
Proc. SPIE 7729, Investigation of gunshot residue patterns using milli-XRF-techniques: first experiences in casework, 772917 (3 June 2010); doi: 10.1117/12.853852
Proc. SPIE 7729, GSR particles and their evidential value, 772919 (3 June 2010); doi: 10.1117/12.853938
Proc. SPIE 7729, The Bayesian approach to reporting GSR analysis results: some first-hand experiences, 77291B (3 June 2010); doi: 10.1117/12.853446
Proc. SPIE 7729, Optimal compression and binarization of signature profiles for automated bullet identification systems, 77291C (3 June 2010); doi: 10.1117/12.859858
Proc. SPIE 7729, Topography measurements for correlations of standard cartridge cases, 77291D (10 June 2010); doi: 10.1117/12.859918
Advancements in Optical Microscopy I
Proc. SPIE 7729, Transmission-type angle deviation microscope with NA=0.65 for 3D measurement, 77291G (3 June 2010); doi: 10.1117/12.850984
Proc. SPIE 7729, Resolution improvement in coherent diffractive imaging (ptychography), 77291H (3 June 2010); doi: 10.1117/12.853346
Proc. SPIE 7729, A new method of high resolution, quantitative phase scanning microscopy, 77291I (3 June 2010); doi: 10.1117/12.853339
Proc. SPIE 7729, Dielectric slot tip for scanning near-field microwave microscope, 77291K (3 June 2010); doi: 10.1117/12.853727
Proc. SPIE 7729, Performance of a combined chromatic confocal microscope with thin film reflectometer, 77291L (3 June 2010); doi: 10.1117/12.853517
Proc. SPIE 7729, Numerical simulation of photonic crystal based nano-resonators on scanning probe tip for enhanced light confinement, 77291M (3 June 2010); doi: 10.1117/12.853508
Food Analysis using Microscopy
Proc. SPIE 7729, Apple cuticle: the perfect interface, 77291P (9 June 2010); doi: 10.1117/12.853913
Proc. SPIE 7729, Starch granule formation and protein deposition in wheat (Triticum aestivum L.) starchy endosperm cells is altered by high temperature during grain fill, 77291R (3 June 2010); doi: 10.1117/12.853183
Proc. SPIE 7729, Quality and utilization of food co-products and residues, 77291U (10 June 2010); doi: 10.1117/12.853760
Proc. SPIE 7729, Microstructure of Desmanthus illinoensis, 77291V (3 June 2010); doi: 10.1117/12.853464
Biological
Proc. SPIE 7729, Microscopic examination on cytological changes in Allium cepa and shift in phytoplankton population at different doses of Atrazine, 77291W (3 June 2010); doi: 10.1117/12.853238
Proc. SPIE 7729, Characterization of aeroallergen of Texas panhandle using scanning and fluorescence microscopy, 77291X (8 June 2010); doi: 10.1117/12.853145
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