Scott P. Warrick
Process Engineer at Cirrus Logic Inc
SPIE Involvement:
Author
Publications (20)

Proceedings Article | 26 March 2019 Paper
Jeffrey Weintraub, Scott Warrick
Proceedings Volume 10959, 109592C (2019) https://doi.org/10.1117/12.2515080
KEYWORDS: Process modeling, Data modeling, Performance modeling, Statistical analysis

Proceedings Article | 13 March 2018 Presentation + Paper
Scott Warrick, Jeffrey Weintraub
Proceedings Volume 10585, 105851T (2018) https://doi.org/10.1117/12.2297379
KEYWORDS: Data modeling, Process modeling, Particles, Machine learning, Contamination control, Process control, Data processing, Data analysis, Statistical modeling, Control systems

Proceedings Article | 28 March 2017 Presentation + Paper
Jeffrey Weintraub, Scott Warrick
Proceedings Volume 10145, 101450S (2017) https://doi.org/10.1117/12.2258031
KEYWORDS: Process control, Inspection, Failure analysis, Semiconducting wafers, Defect inspection

Proceedings Article | 21 April 2016 Paper
Jeffrey Weintraub, Scott Warrick
Proceedings Volume 9778, 97780X (2016) https://doi.org/10.1117/12.2218623
KEYWORDS: Statistical analysis, Process control, Manufacturing, Probability theory, Statistical methods, Monte Carlo methods, Ions, Diagnostics, Distributed interactive simulations, Excel

Proceedings Article | 3 May 2007 Paper
M. Benndorf, V. Farys, R. Feilleux, S. Warrick, S. Gaugiran, C. Sourd, K. Mestadi, D. Cruau
Proceedings Volume 6533, 653308 (2007) https://doi.org/10.1117/12.736328
KEYWORDS: Thin film coatings, Scanners, Semiconducting wafers, Digital watermarking, Inspection, Immersion lithography, Lithography, Particles, Photomasks, Semiconductors

Showing 5 of 20 publications
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